Type of research: basic Duration from: 01/01/91. to 12/31/93. Papers on project (total): 113
Papers on project quoted in Current Contents: 57
Institution name: Institut "Ruđer Bošković", Zagreb (98) Department/Institute: Materials Research and Electronic Department Address: Bijenička 54 City: 10000 - Zagreb, Croatia
Communication
Phone: 385 (0)1-4561-111
Fax: 385 (0)1-425-497
E-mail: Desnica@irb.hr
Summary: "In the project "Study of defects in Semiconductors"
microscopic defects (native defects, impurities, dopants, complexes...)
has been studied as well as their influence on the macroscopic properties
of semiconductors. Main goals of this research was the study of specific,
today most interesting, defects and related fundamental physical
phenomena at the atomic scale, in order to understand and get control
over defects, as a vital prerequisite for optimization of properties and
finally the "engineering" of these important materials. A number of
specific problems has been investigated and solved successfully in
different semiconductors, particularly in: Mono- and polycrystalline
silicon: The properties and role of oxygen, carbon and metallic
impurities, including their interactions during various treatments
(thermal treatment, gamma-irradiation etc.) have been elucidated, and
also of hydrogen and carbon in amorphous silicon. In gallium arsenide:
defects with deep levels, which were thoroughly characterized (energy
levels; cross sections etc.) It has been shown that these defects are
responsible for a number of previously unresolved low-T properties
(dramatic changes of photosensitivity, transient photoconductivity,
persistent currents etc.). In cadmium sulfide: cadmium vacancy has been
identified as the main native defect responsible for the compensation of
electrical activity of donor dopants. It has been demonstrated how
cadmium vacancies can be introduced or annihilated in a controlled way.
Specific characteristic of this project was extensive international
cooperations, which gave us an access to a number of modern research
techniques, and resulted in joint publications with 17 foreign scientific
institutions. Results of the five-year project were published in 73
publications in international journals, books and proceedings (please see
enclosed lists). Among them, 53 papers were published in the most
prominent journals, secondary refereed in "Current Contents" (CC).
Keywords: semiconductors, defects, impurities, dopants, deep levels, silicon, gallium arsenide, cadmium sulfide, Raman spectroscopy, IR spectroscopy, micro-FTIR,.
Research goals: Study of defects is an exceptionally important
part of the semiconductors physics, as defects govern many of the most
important macroscopic properties of these materials. Therefore, the
applicability and usability of semiconductors in modern technologies
(electronics, micro- and opto-electronics, informatics,
telecommunications, automatization etc.) is limited by the knowledge of
the basic properties of defects. The goal of proposed study was to
acquire and deepen the knowledge about fundamental properties of most
important defects (impurities, dopants, native defects and their
complexes) in semiconductors, and to solve a number of specific, today
most interesting open problems of the particular defects in Si, GaAs etc..
The goal was to investigate and understand: a) basic properties of
particular defects at the atomic level, and -where possible-, to determine
microscopic structure of defect and its immediate surroundings; b)
determine its dynamic properties (interactions between defects and with
host atoms due to thermal, optical and other excitations) and c) to
determine the influence of particular defects on macroscopic properties of
materials. Defects were studied in a number of semiconductors, which were
selected either as being very important today or as prospective in the
future. In silicon (monocrystalline, polycrystalline and amorphous) most
common and most important impurities were studied (oxygen, carbon,
hydrogen..). In compound semiconductors (particularly in gallium arsenide,
indium phosphide and cadmium sulfide) primarily native defects and
complexes were studied. Furthermore, the goal was to achieve and maintain
the highest scientific standards and the quality of these investigation.
We believe that all these goals were successfully fulfilled: A number of
specific problems of today's most interesting defects have been either
solved or an important scientific contribution has been added to their
understanding. Results of these research have been published in a
considerable number of papers in best international journals (please see
enclosed List of publications).
COOPERATION - PROJECTS
Name of project
: 1-03-066 Vibracijski fenomeni i interakcije u
kondenziranoj materiji Name of institution: Institut " Rudjer Bošković " City: 10000 - Zagreb, Croatia
Name of project
: 1-03-180 Istraživanje tankih poluvodičkih
filmova Name of institution: Institut "Rudjer Bošković" City: 10000 - Zagreb, Croatia
COOPERATION - INSTITUTIONS
Name of institution
: Universita di Pavia Type of institution: Economical/Production City: Pavia, Italija
Name of institution
: MEMS Electronic Materials Type of institution: University/Faculty City: Novara, Italija
Name of institution
: CNR, Type of institution: University/Faculty City: Pavia, Italija
Name of institution
: Universita di Modena Type of institution: Economical/Production City: Modena, Italija
Name of institution
: Universita di Trento Type of institution: Economical/Production City: Trento, Italija
Name of institution
: IRST Type of institution: University/Faculty City: Trento, Italija
Name of institution
: Siemens Telecomunicazioni Type of institution: State institute City: Milano, Italija
Name of institution
: Instituto MASCPEC_CNR Type of institution: University/Faculty City: Parma, Italija
Name of institution
: Universite Louis Pasteur Type of institution: Economical/Production City: Strasbourg, Francuska
Name of institution
: Universitat Konstanz Type of institution: Economical/Production City: Konstanz, Njemačka
Name of institution
: Fraunhofer Institut Type of institution: University/Faculty City: Freiburg, Njemačka
Name of institution
: Mobil Solar Energy Corp. Type of institution: University/Faculty City: Boston, USA
Name of institution
: Oak Ridge National Laboratory Type of institution: University/Faculty City: Oak Ridge, USA
Name of institution
: Cabot Corp. Type of institution: University/Faculty City: Billerica, MA, USA
Name of institution
: University of Albany Type of institution: Economical/Production City: Albany, USA
Name of institution
: ICTP Type of institution: University/Faculty City: Trst, Italija
Name of institution
: CNRS Type of institution: University/Faculty City: Strasbourg, Francuska